Scanning Electron Microscope
EM-30PLUS Operating Manual
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Example: When observing non-coated FPCB specimen in SE mode.
High Vacuum
Low Vacuum
2.2.3 Selection of Detector Mode
It is a button for selecting the detector mode of electron microscope (EM).
SE Mode: Mode: It receives the signal of Secondary Electron (SE) and displays the image,
which is mainly used for observing specimen surface.
(It is changed into SE Mode if you press BSE Mode button)
BSE Mode: It receives the signal of Back Scattered Electron (BSE) and displays the image,
with which you can observe the element composition of specimen.
(It is changed into BSE Mode if you press SE Mode button)
SE/BSE Mode: It compares and observes two images of SE and BSE at the same time.
SE+BSE Mode: It displays the composed images of SE and BSE.
