Associated Research HYPOTULTRA III 7620, Operation And Service Manual, Page: 61 / 148

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OFF), Scanner Channel selections if installed, and Prompt.
Ramp-HI
The Ramp-HI function is active during the Ramp period only. Ramp-HI will allow current
higher than the normal Max-Lmt current setting of the DC Withstand Voltage test to avoid false
failure due to charging current.
Charge–LO
The Charge-LO function is used to check if the cables are connected properly at the beginning
of a test. A capacitive DUT will draw charging current on the DC Withstand Voltage test when
the Output is activated. If the charging current is lower than the setting, the test cables may not
be connected properly. The instrument can set the Charge-LO parameter manually or
automatically. To manually set the Charge-LO current, use the up and down arrow keys or the
ENTER key and scroll the highlighted area to the Charge-LO current parameter. Enter the new
Charge-LO current via the numeric keypad and then press the ENTER key to accept the new
parameter or press the EXIT key to escape from the edit. To automatically set the Charge-LO
current, use the up and down arrow keys or the ENTER key and scroll the highlighted area to
the Charge-LO current parameter. Set the voltage and ramp times to the values that will be
used on the DUT and connect the test cables or test fixture between the instrument and DUT.
Press the test button.
Please be aware that the program will activate high voltage on the output
connector while the Test button is pressed.
The program will read the charging current of DUT and set the Charge-LO current at
approximately one half (1/2) of the reading. The instrument will beep and the new value will
automatically be updated in the field and does not allow an escape to the original value or
require that the ENTER key be used to accept the new parameter.
4.3.4. Insulation Resistance, Model 7650 Only
From the Test Parameter-review screen, scroll the highlighted area to the Test Type and press
the “Edit” soft key.
The Test Parameter edit screen will now be displayed. Now press the “Change” soft key until
the letters IR appear in the parameter field. Press the ENTER key to select the IR test. The IR
parameter-review screen will appear as follows:
T e s t T y p e I R C h a r g e L O X . X X X u A
V o l t a g e X X X X V S c a n n e r H L H L H L H L
^
M a x L m t x x x x x M E x S c a n H L L L H L L H
M i n L m t x x x x x M P r o m p t x x x x x x x
v
R a m p U P 9 9 9 . 9 s
D e l a y 9 9 9 . 9 s
< >
R a m p D N 9 9 9 . 9 s
C o n n e c t O N
E d i t
WARNING