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Table 33-42. Sampling Configuration
Sampling Point Description
Delay
[FSDLY]
Phase
[FSPHS]
QSPI_SMPR for
Full Speed
Setting
N/1
sampling with non-inverted clock, 1 sample delay 0
0
0x0000000x
I/1
sampling with inverted clock, 1 sample delay
0
1
0x0000002x
N/2
sampling with non-inverted clock, 2 samples
delay
1
0
0x0000004x
I/2
sampling with inverted clock, 2 samples delay
1
1
0x0000006x
1. 'x' is not considered here
Depending on the actual delay and the serial flash clock frequency, the appropriate
sampling point can be chosen. The following remarks should be considered when
selecting the appropriate setting:
• Theoretically there should be two settings possible to capture the correct data, since
the serial flash output is valid for 1 clock cycle, disregarding rise and fall times and
timing uncertainties.
• Depending on the timing uncertainties, it may turn out in actual applications that only
one possible sample position remains. This is subject to careful consideration
depending on the actual implementation.
• The delay t
Del,total
is an absolute size to shift the point in time when the serial flash
data get valid at the QuadSPI input.
• For decreasing frequency of the serial flash clock the distance between the edges
increases. So for large differences in the frequency the required setting may change.
33.12.2.1.2 DQS sampling method
NOTE
This mode may not be available on this chip. See the chip-
specific QuadSPI information for the read modes that this chip
supports.
Data sampling in SDR mode can be supported using the DQS sampling method. Refer to
Data Strobe (DQS) sampling method
for more details.
Sampling of Serial Flash Input Data
MWCT101xS Series Reference Manual, Rev. 3, 07/2019
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NXP Semiconductors
Содержание MWCT101 S Series
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