51.4.4 Boundary scan register
The boundary scan register is connected between TDI and TDO when the EXTEST,
SAMPLE, or SAMPLE/PRELOAD instructions are active. It is used to:
• Capture input pin data
• Force fixed values on output pins
• Select a logic value and direction for bidirectional pins
Each bit of the boundary scan register represents a separate boundary scan register cell,
as described in the IEEE 1149.1-2001 standard and discussed in
. The size
of the boundary scan register and bit ordering is device-dependent and can be found in
the device BSDL file.
51.5 Functional description
This section explains the JTAGC functional description.
51.5.1 JTAGC reset configuration
When in reset, the TAP controller is forced into the Test-Logic-Reset state, thus disabling
the test logic and allowing normal operation of the on-chip system logic. In addition, the
instruction register is loaded with the IDCODE instruction.
51.5.2 IEEE 1149.1-2001 (JTAG) TAP
The JTAGC block uses the IEEE 1149.1-2001 TAP for accessing registers. This port can
be shared with other TAP controllers on the MCU. Ownership of the port is determined
by the value of the currently loaded instruction.
Data is shifted between TDI and TDO through the selected register starting with the least
significant bit, as illustrated in the following figure. This applies for the instruction
register, test data registers, and the bypass register.
Selected register
LSB
MSB
TDI
TDO
Figure 51-3. Shifting data through a register
Chapter 51 JTAG Controller (JTAGC)
MWCT101xS Series Reference Manual, Rev. 3, 07/2019
NXP Semiconductors
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