50.4 Debug port pin descriptions
After POR, all debug port pins default to their JTAG functionality and can later be
reassigned to their alternate functionalities. In SWD mode, JTAG_TDI can be configured
for alternate GPIO functions.
Table 50-5. Debug port pins
Pin name
JTAG debug port
SWD debug port
Internal pull-up/
down
Type
Description
Type
Description
JTAG_TMS/
SWD_DIO
I/O
JTAG Test Mode
Selection
I/O
Serial Wire Data
Pull-up
JTAG_TCLK/
SWD_CLK
I
JTAG Test Clock
I
Serial Wire Clock
Pull-down
JTAG_TDI
I
JTAG Test Data
Input
-
-
Pull-up
JTAG_TDO/
TRACE_SWO
O
JTAG Test Data
Output
O
Trace output over a
single pin
N/C
50.5 System TAP connection
The system JTAG controller is connected in parallel to the Arm Test Access Port (TAP)
controller. The system JTAG controller Instruction Register (IR) codes overlay the Arm
JTAG controller IR codes without conflict. Refer to the IR codes table for a list of the
available IR codes. The output of the TAPs (TDO) are muxed based on the IR code
which is selected. This design is fully JTAG compliant and appears to the JTAG chain as
a single TAP. At power on reset, Arm's IDCODE (IR = 1110b) is selected.
50.5.1 IR codes
Table 50-6. JTAG instructions
Instruction
Code[3:0]
Instruction summary
IDCODE
0000
Selects device identification register for shift
SAMPLE/PRELOAD
0010
Selects boundary scan register for shifting, sampling, and
preloading without disturbing functional operation
SAMPLE
0011
Selects boundary scan register for shifting and sampling
without disturbing functional operation
EXTEST
0100
Selects boundary scan register while applying preloaded
values to output pins and asserting functional reset
Table continues on the next page...
Chapter 50 Debug
MWCT101xS Series Reference Manual, Rev. 3, 07/2019
NXP Semiconductors
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