![NXP Semiconductors MWCT101 S Series Скачать руководство пользователя страница 469](http://html1.mh-extra.com/html/nxp-semiconductors/mwct101-s-series/mwct101-s-series_reference-manual_1722210469.webp)
On a power-on reset, the POR bit in the system reset register is set, indicating the user
should perform the WDOG fast test.
21.4.7.1 Testing each byte of the counter
The test procedure follows these steps:
1. Program the preferred watchdog timeout value in the TOVAL register during the
watchdog configuration time period.
2. Select a byte of the counter to test using the CS[TST] = 10b for the low byte;
CS[TST] = 11b for the high byte.
3. Wait for the watchdog to timeout. Optionally, in the idle loop, increment RAM
locations as a parallel software counter for later comparison. Because the RAM is not
affected by a watchdog reset, the timeout period of the watchdog counter can be
compared with the software counter to verify the timeout period has occurred as
expected.
4. The watchdog counter times out and forces a reset.
5. Confirm the WDOG flag in the system reset register is set, indicating that the
watchdog caused the reset. (The POR flag remains clear.)
6. Confirm that CS[TST] shows a test (10b or 11b) was performed.
If confirmed, the count and compare functions work for the selected byte. Repeat the
procedure, selecting the other byte in step 2.
NOTE
CS[TST] is cleared by a POR only and not affected by other
resets.
21.4.7.2 Entering user mode
After successfully testing the low and high bytes of the watchdog counter, the user can
configure CS[TST] to 01b to indicate the watchdog is ready for use in application user
mode. Thus if a reset occurs again, software can recognize the reset trigger as a real
watchdog reset caused by runaway or faulty application code.
As an ongoing test when using the default clock source, software can periodically read
the CNT register to ensure the counter is being incremented.
Chapter 21 Watchdog timer (WDOG)
MWCT101xS Series Reference Manual, Rev. 3, 07/2019
NXP Semiconductors
469
Содержание MWCT101 S Series
Страница 2: ...MWCT101xS Series Reference Manual Rev 3 07 2019 2 NXP Semiconductors...
Страница 42: ...MWCT101xS Series Reference Manual Rev 3 07 2019 42 NXP Semiconductors...
Страница 50: ...Conventions MWCT101xS Series Reference Manual Rev 3 07 2019 50 NXP Semiconductors...
Страница 70: ...Aliased bit band regions MWCT101xS Series Reference Manual Rev 3 07 2019 70 NXP Semiconductors...
Страница 78: ...Pinout diagrams MWCT101xS Series Reference Manual Rev 3 07 2019 78 NXP Semiconductors...
Страница 96: ...WCT101xS safety concept MWCT101xS Series Reference Manual Rev 3 07 2019 96 NXP Semiconductors...
Страница 130: ...Functional description MWCT101xS Series Reference Manual Rev 3 07 2019 130 NXP Semiconductors...
Страница 200: ...Initialization application information MWCT101xS Series Reference Manual Rev 3 07 2019 200 NXP Semiconductors...
Страница 284: ...Functional description MWCT101xS Series Reference Manual Rev 3 07 2019 284 NXP Semiconductors...
Страница 430: ...Functional Description MWCT101xS Series Reference Manual Rev 3 07 2019 430 NXP Semiconductors...
Страница 472: ...Application Information MWCT101xS Series Reference Manual Rev 3 07 2019 472 NXP Semiconductors...
Страница 508: ...Reset memory map and register descriptions MWCT101xS Series Reference Manual Rev 3 07 2019 508 NXP Semiconductors...
Страница 528: ...Module clocks MWCT101xS Series Reference Manual Rev 3 07 2019 528 NXP Semiconductors...
Страница 634: ...SRAM configuration MWCT101xS Series Reference Manual Rev 3 07 2019 634 NXP Semiconductors...
Страница 696: ...Initialization and application information MWCT101xS Series Reference Manual Rev 3 07 2019 696 NXP Semiconductors...
Страница 818: ...Functional description MWCT101xS Series Reference Manual Rev 3 07 2019 818 NXP Semiconductors...
Страница 960: ...Functional description MWCT101xS Series Reference Manual Rev 3 07 2019 960 NXP Semiconductors...
Страница 970: ...Memory Map and Register Definition MWCT101xS Series Reference Manual Rev 3 07 2019 970 NXP Semiconductors...
Страница 992: ...ADC calibration scheme MWCT101xS Series Reference Manual Rev 3 07 2019 992 NXP Semiconductors...
Страница 1118: ...Application information MWCT101xS Series Reference Manual Rev 3 07 2019 1118 NXP Semiconductors...
Страница 1294: ...Initialization Procedure MWCT101xS Series Reference Manual Rev 3 07 2019 1294 NXP Semiconductors...
Страница 1348: ...Functional description MWCT101xS Series Reference Manual Rev 3 07 2019 1348 NXP Semiconductors...
Страница 1366: ...Functional description MWCT101xS Series Reference Manual Rev 3 07 2019 1366 NXP Semiconductors...
Страница 1514: ...Functional description MWCT101xS Series Reference Manual Rev 3 07 2019 1514 NXP Semiconductors...
Страница 1726: ...Debug and security MWCT101xS Series Reference Manual Rev 3 07 2019 1726 NXP Semiconductors...
Страница 1740: ...Initialization application information MWCT101xS Series Reference Manual Rev 3 07 2019 1740 NXP Semiconductors...
Страница 1760: ...MWCT101xS Series Reference Manual Rev 3 07 2019 1760 NXP Semiconductors...