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Keysight N4372E Lightwave Component Analyzer User’s Guide
6
Definition of Terms
Signal Relationships in Opto-Electric Devices
The LCA measurement technique is built upon concepts used in
characterizing RF and microwave devices. “S-parameter” or scattering
matrix techniques have proven to be convenient ways to characterize
device performance.
The following section will discuss how similar techniques are used in
characterizing devices in the lightwave domain. This is intended to show
the basis on which EO and OE responsivity measurements are defined.
The figure below is a general representation of a lightwave system,
showing input and output signals in terms of terminal voltages, input and
output currents, and optical modulation power.
S-parameters are used to describe the transmitted and reflected signal
flow within a device or network. For the model, the following S-parameters
are defined:
where:
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