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Contents
Page
1.
Preface ································································································· 1
1.1
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Initial setting at the time of delivery ······················································· 1
2.
Confirmation prior to use ············································································ 2
2.1
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Unpacking ···················································································· 2
2.2
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Cautions for handling ········································································ 2
3.
Name of parts and functions ········································································ 3
3.1
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Front panel ···················································································· 3
3.2
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Rear panel ····················································································· 6
4.
Preparation prior to use ·············································································· 8
4.1
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Zero adjustment of output voltmeter······················································· 8
4.2
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Connection of protective ground terminal ················································ 8
4.3
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Connection with external control device ·················································· 8
4.4
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Connection of high voltage cable ·························································· 8
4.5
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Connection of power supply cable ························································· 9
4.6
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Throw in and shut off of power source ···················································· 9
4.7
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Before the test ················································································ 9
5.
Setting items in each mode ········································································· 10
5.1
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READY status ··············································································· 10
5.2
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Setting mode of test condition ····························································· 10
5.3
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Memory write-in mode ····································································· 10
5.4
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Memory read-out mode ···································································· 10
6.
Kind of test mode and flow of setting ····························································· 11
6.1
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Kind of test mode ··········································································· 11
6.2
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Flow of setting ·············································································· 11
7.
Setting of test mode ················································································· 12
7.1
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Status of display and expression in instruction manual ································ 12
7.2
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Selection of each test mode ································································ 12
8.
Setting of test condition for withstanding voltage test ·········································· 13
8.1
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Test range of withstanding voltage test ··················································· 13
8.2
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Referential voltage ·········································································· 14
8.3
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High limit of leak current ·································································· 16
8.4
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Low limit of leak current ··································································· 17
8.5
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Test time······················································································ 19
9.
Memory function ···················································································· 21
9.1
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Configuration of memory ·································································· 21
9.2
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Memory write-in ············································································ 21
9.3
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Memory read-out ············································································ 22
