
TC32306FTG
2015-10-01
85
Test Characteristics: G
v (LNA)
Fig 11-4 Test Circuit (LNA Gain)
Test Characteristics: DR
fm,
V
RSSI1,
V
RSSI2,
V
RSSI3
* Measure DRfm by connecting (a).
Measure V
RSSI1
/V
RSSI2
/V
RSSI3
by connecting (b).
Fig 11-5 Test Circuit (RF-Receiving)
Test Characteristics: P
TX (315)1
* In ASK, measure by connecting the signal source to 35 pin.
In FSK, measure by setting 35 pin to low level. (Set to
unmodulated by register)
Fig 11-6 Test Circuit (RF-Transmitting)
35
16
17
18
12
50 Line
Signal
Source
Measuring
Iinstrument
TC
32306F
TG
11
12
50 Line
9
50 Line
Signal
Source
Measuring
Iinstrument
TC
32306F
TG
6
35
Signal
Source
Measuring
Instrument (a)
Measuring
Instrument (b)
TC32306FTG
11
12
50
Line