
TC32306FTG
2015-10-01
83
11. Typical Test Circuit
The components illustrated in the test circuit diagrams that follow are only used to confirm device characteristics.
Toshiba does not guarantee that these components will prevent malfunction or failure in your particular application
device.
Test Characteristics: V
DD (5V)
, V
DD (3V),
f
RF (315),
f
RF (434),
f
RF (868),
f
RF (915)
Notice:
Measure after the parts tuning that shows a part number. TC32306FTG supply voltage is selected by SW1 and SW2. SW3 and SW4
allow selecting the crystal oscillator and external signal.
Fig 11-1 Typical Test Circuit
19
20
21
22
24
25
26
27
23
9
8
7
6
4
3
2
5
36
35
34
33
32
31
30
29
28
16
17
18
13
14
15
10
11
12
TC32306FTG
0
.1
µ
F
100pF
100pF
100pF
0.1µF
7
pF
7
pF
30.32MHz
0
.1
µ
F
50
Ω
Li
ne
0.1µF
0.1µF
0
.01
µ
F
330pF
1000
pF
1000
pF
0
.1
µ
F
1000
pF
1000
pF
D
ET
_
T
MO
N
I2
D
ET
_
T
MO
N
I3
IO_GND
DATA_IO
DET_TMONI1
COM_VDD
MISO
MOSI
CLK
CS
D
_
R
EG
X
_
OU
T
X
_
IN
PL
L
_
GN
D
PL
L
_
R
EG
T
EST
M
O
D
E
1
M
O
D
E
2
R
ESET
PA
_
GN
D
2
T
X
_
SW
PA_GND1
PA_OUT
IF_REF
A_GND
A_REG
A_VDD_3V
RF_OUT
A
_
VD
D
_
5
V
RF
_
IN
RF
_
D
EC
RX
_
SW
R
SSI
_
OU
T
3
V
/5
V
D
ET
_
T
MO
N
I4
EN
B
SW1
SW
2
SW3
SW4
0.01µF
1
0.1µF
50
Line
51
100
50
Li
ne
51
51