Stratasys J750/J735/J720 User Guide
4 Operating and Maintaining the Printer
DOC-08040 Rev. R
4-123
Close
Click to close the
Built-in Tests
screen.
Summary
On the right side of the screen, a symbol represents the combined results of all
the tests run, using the symbols from the
Status
column.
All tests successfully completed.
At least one test failed.
Not all tests performed.
Test Descriptions and Troubleshooting
The following table lists the name of each test in the Built-in Tests suite, together
with its description and a possible reason for its failure. If you need assistance,
contact your Stratasys service provider.
Test Name
Description
Possible Reason for Failure
FIFO Non-Interrupt/
FIFO Interrupt
• Tests the data queue in the
DATA PCI card.
• Tests the Windows interrupt.
• If both FIFO tests fail:
Faulty DATA_PCI card.
• If only the FIFO Interrupt test fails:
Faulty Windows interrupt.
System Info
Compares the following parameter
values with the minimum
requirements.
• physical memory
• available memory
• free space on disk
• monitor resolution
Failure of RAM memory allocation in
the printer computer.
Parameter Sanity
Check
Compares the values of all printer
parameters (in cfg files) to the
required values.
One or more of the printer parameters
is not within the required range.
Details appear in the BIT report.
RFID
Verifies the presence of RFID tags
on material cartridges, and tests
them (by writing data to the tag and
then reading it).
• Faulty RFID reader.
• Faulty RFID reader power supply.
• Faulty or misaligned RFID tag.
• High level of electromagnetic noise
around the RFID tag.
Sub-System
Communications
Tests communication between
printer components.
• Disconnected communications
cable.
• Faulty cable.
Cabin Temperature
Tests the temperature level in the
build-tray area.
• Faulty temperature sensor (OHDB).
• Failure of exhaust fan.
• Clogged exhaust filter.
Head Voltages
Checks the control of voltages
supplied to the print heads.
Faulty print-head driver card(s).