12-49
ET 200L, ET 200L-SC and ET 200L-SC IM-SC Distributed I/O Device
EWA 4NEB 780 6009-02c
Analog value formation
Measurement principle
integrative
Integration and conversion time/
resolution per channel
Parameterized
Integration time in ms
Conversion time in ms
Cycle time in ms
yes
50
110
110
60
130
130
Resolution (incl. overrange/rep-
resentation in two’s complement)
S7 format
0...600
W
Pt100 climatic
Pt100 standard
Ni100 standard
14 bits
0.1
C/digit
0.1
C/digit
0.1
C/digit
S5 format
0...600
W
Pt100 climatic
Pt100 standard
Ni100 standard
13 bits
0.05
C/digit
0.5
C/digit
0.5
C/digit
Interference voltage suppres-
sion for interference fre-
quency f1 in Hz
50 60
Sensor Selection Data
Input ranges (rated values)/input
resistance
0...600
W
/ >1 M
W
Pt100 (climatic; -120...+130
C) / >1 M
W
Pt100 (standard; -200...+850
C) / >1 M
W
Ni100 (standard; -60...+250
C) / >1 M
W
Permitted input voltage
for resistance measurement input
and constant current inputs/out-
puts (destruction limit)
max.10 V perma-
nent;
25 V for max. 1 s
(pulse duty factor
1:20)
Connection of sensors
For resistance measurement
with
–
4-conductor connection
yes; with compensa-
tion of the line re-
sistances
Characteristic curve linearization
yes; parameterized
–
For Pt100 to DIN IEC 751
–
For Ni100 to DIN 43760
Temperature compensation
no
Smoothing of measured values
Step
None
Weak
Medium
Strong
yes; set by parame-
ters in 4 steps by
digital filtering
Time constant
1x cycle time
8x cycle time
64x cycle time
128x cycle time
SC Analog Electronic Modules – Technical Data