2
Subject to change without notice
KONFORMITÄTSERKLÄRUNG
DECLARATION OF CONFORMITY
DECLARATION DE CONFORMITE
Hersteller HAMEG
Instruments
GmbH
Manufacturer Industriestraße
6
Fabricant D-63533
Mainhausen
Die HAMEG Instruments GmbH bescheinigt die Konformität für das Produkt
The HAMEG Instruments GmbH declares conformity of the product
HAMEG Instruments GmbH déclare la conformite du produit
Bezeichnung:
Oszilloskop
Product name:
Oscilloscope
Designation:
Oscilloscope
Typ / Type / Type:
HMO3524
mit / with / avec:
HO720
Optionen / Options / Options: HO730, HO740
mit den folgenden Bestimmungen / with applicable regulations / avec les
directives suivantes
EMV Richtlinie 89/336/EWG ergänzt durch 91/263/EWG, 92/31/EWG
EMC Directive 89/336/EEC amended by 91/263/EWG, 92/31/EEC
Directive EMC 89/336/CEE amendée par 91/263/EWG, 92/31/CEE
Niederspannungsrichtlinie 73/23/EWG ergänzt durch 93/68/EWG
Low-Voltage Equipment Directive 73/23/EEC amended by 93/68/EEC
Directive des equipements basse tension 73/23/CEE amendée par
93/68/CEE
Angewendete harmonisierte Normen / Harmonized standards applied
Normes harmonisées utilisées:
Sicherheit / Safety / Sécurité:
EN 61010-1:2001 (IEC 61010-1:2001)
Messkategorie / Measuring category / Catégorie de mesure: I
Überspannungskategorie / Overvoltage category /
Catégorie de surtension: II
Verschmutzungsgrad / Degree of pollution / Degré de pollution: 2
Elektromagnetische Verträglichkeit / Electromagnetic compatibility /
Compatibilité électromagnétique
EN 61326-1/A1 Störaussendung / Radiation / Emission:
Tabelle / table / tableau 4; Klasse / Class / Classe B.
Störfestigkeit / Immunity / Imunitée: Tabelle / table / tableau A1.
EN 61000-3-2/A14 Oberschwingungsströme / Harmonic current emissions
Émissions de courant harmonique: Klasse / Class / Classe D.
EN 61000-3-3 Spannungsschwankungen u. Flicker / Voltage fl uctuations
and fl icker / Fluctuations de tension et du fl icker.
Datum / Date / Date
01. 03. 2009
Unterschrift / Signature / Signatur
Holger
Asmussen
Manager
General information regarding the CE marking
HAMEG instruments fulfi ll the regulations of the EMC directive. The conformity
test made by HAMEG is based on the actual generic- and product standards. In
cases where different limit values are applicable, HAMEG applies the severer
standard. For emission the limits for residential, commercial and light industry
are applied. Regarding the immunity (susceptibility) the limits for industrial
environment have been used.
The measuring- and data lines of the instrument have much infl uence on
emission and immunity and therefore on meeting the acceptance limits.
For different applications the lines and/or cables used may be different. For
measurement operation the following hints and conditions regarding emission
and immunity should be observed:
1. Data cables
For the connection between instrument interfaces and external devices,
(computer, printer etc.) suffi ciently screened cables must be used. Without
a special instruction in the manual for a reduced cable length, the maximum
cable length of a dataline must be less than 3 meters and not be used outside
buildings. If an interface has several connectors only one connector must have
a connection to a cable.
Basically interconnections must have a double screening. For IEEE-bus
purposes the double screened cable HZ72 from HAMEG is suitable.
2. Signal cables
Basically test leads for signal interconnection between test point and
instrument should be as short as possible. Without instruction in the manual
for a shorter length, signal lines must be less than 3 meters and not be used
outside buildings.
Signal lines must screened (coaxial cable - RG58/U). A proper ground
connection is required. In combination with signal generators double screened
cables (RG223/U, RG214/U) must be used.
3. Infl uence on measuring instruments
Under the presence of strong high frequency electric or magnetic fi elds, even
with careful setup of the measuring equipment, infl uence of such signals is
unavoidable.
This will not cause damage or put the instrument out of operation. Small
deviations of the measuring value (reading) exceeding the instruments
specifi cations may result from such conditions in individual cases.
4. RF immunity of oscilloscopes.
4.1 Electromagnetic RF fi eld
The infl uence of electric and magnetic RF fi elds may become visible (e.g. RF
superimposed), if the fi eld intensity is high. In most cases the coupling into
the oscilloscope takes place via the device under test, mains/line supply, test
leads, control cables and/or radiation. The device under test as well as the
oscilloscope may be effected by such fi elds.
Although the interior of the oscilloscope is screened by the cabinet, direct
radiation can occur via the CRT gap. As the bandwidth of each amplifi er stage
is higher than the total –3dB bandwidth of the oscilloscope, the infl uence of RF
fi elds of even higher frequencies may be noticeable.
4.2 Electrical fast transients / electrostatic discharge
Electrical fast transient signals (burst) may be coupled into the oscilloscope
directly via the mains/line supply, or indirectly via test leads and/or control
cables. Due to the high trigger and input sensitivity of the oscilloscopes, such
normally high signals may effect the trigger unit and/or may become visible
on the TFT, which is unavoidable. These effects can also be caused by direct
or indirect electrostatic discharge.
HAMEG Instruments GmbH
G e n e r a l i n f o r m a t i o n r e g a r d i n g t h e C E m a r k i n g
