Keithley 2520, User Manual, Page: 173 / 329

11-14 Status Structure Model 2520 User’s Manual
Measurement event register
The used bits of the Measurement Event Register (shown in Figure 11-6 ) are described as
follows:
•
Bit B0
— Not used.
•
Bit B1, HW Interlock (INT)
— Set bit indicates that the hardware interlock line
on the testhead is at a digital low (asserted). Outputs can be turned on.
•
Bit B2, MSR1 Overflow (M1O)
— Set bit indicates that the laser diode voltage
measurement is in an overflow condition.
•
Bit B3, MSR2 Overflow (M2O)
— Set bit indicates that the photodiode detector
#1 current measurement is in an overflow condition.
•
Bit B4, MSR3 Overflow (M3O)
— Set bit indicates that the photodiode detector
#2 current measurement is in an overflow condition.
•
Bit B5
— Not used.
•
Bit B6, Reading Available (RAV)
— Set bit indicates that a reading has been pro-
cessed and is available.
•
Bit B7, Sweep Aborted (SWA)
— Set bit indicates that the sweep was aborted
before being completed.
•
Bit B8, Sweep Done (SWD)
— Set bit indicates a sweep was completed success-
fully.
•
Bits B9 to B11
— Not used.
•
Bit B12, Over Temperature (OT)
— Set bit indicates that safe operating tempera-
ture of the testhead has been exceeded. Outputs cannot be turned on.
•
Bit B13
— Not used.
•
Bit B14, Source 1 Compliance (S1C)
— Set bit indicates that the laser diode cur-
rent source is in compliance.
•
Bit B15
— Not used.