266
Chapter 5, Advanced Operations
Status Reporting
Status Register Structure Overview
The structure of the register groups used in the Test Set is based upon the status
data structures outlined in the IEEE 488 and SCPI 1994.0 Standards. There are
two types of status data structures used in the Test Set: status registers and status
queues. The general models, components, and operation of each type of status
data structure are explained in the following sections.
Figure 5
Status Data Structure - Register Model
- - -Test Set States Continuously Monitored - - -
15
14
2
0
1
15
14
2
0
1
15
14
2
0
1
&
Logical
OR
Summary Message
Bit
Event Enable
Register
(Selects which Events
can set the Summary
Message Bit)
Event Register
(Latched Conditions)
Positive Transition
Filter
Negative Transition
Filter
(Positive and Negative
Transition Filters select
which transitions of
Condition Bits will set
corresponding Event Bits.)
Condition Register
&
&
&
&
ch4drw3.ds4
Summary of Contents for 8920B
Page 10: ...10 ...
Page 16: ...Contents 16 9 Error Messages Index 673 ...
Page 17: ...17 1 Using HP IB ...
Page 48: ...48 Chapter 1 Using HP IB Remote Local Modes ...
Page 49: ...49 2 Methods For Reading Measurement Results ...
Page 61: ...61 3 HP IB Command Guidelines ...
Page 84: ...84 Chapter 3 HP IB Command Guidelines Guidelines for Operation ...
Page 85: ...85 4 HP IB Commands ...
Page 90: ...90 Adjacent Channel Power ACP ...
Page 116: ...116 Configure I O Configure ...
Page 156: ...156 Call Processing ...
Page 185: ...185 System System SYSTem ERRor Returns integer value quoted string ...
Page 242: ...242 Common Command Descriptions ...
Page 251: ...251 5 Advanced Operations ...
Page 377: ...377 7 IBASIC Controller ...
Page 458: ...458 Chapter 7 IBASIC Controller The TESTS Subsystem ...
Page 640: ...640 Chapter 8 Programming The Call Processing Subsystem Example Programs 11280 SUBEND 11290 ...
Page 643: ...643 9 Error Messages ...
Page 672: ...672 ...
Page 682: ...Index 682 ...