Agilent Technologies 34970A, Service Manual, Page: 171 / 273

608
Serial configuration readback failed
This test re-sends the last
9 byte serial configuration data to all the serial path. The data is
then clocked back into A1U209 and compared against the original 9
bytes sent. A failure occurs if the data do not match.
609 DC gain x1 failed
This test configures for the 10 V range. The dc
amplifier gain is set to X1. The measure customer (MC) input is
connected to the internal TSENSE source which produces 0.6 volts.
A 20 ms ADC measurement is performed and checked against a limit
of 0.6 V ± 0.3 V.
610
DC gain x10 failed
This test configures for the 1 V range. The dc
amplifier gain is set to X10. The measure customer (MC) input is
connected to the internal TSENSE source which produces 0.6 volts.
A 20 ms ADC measurement is performed and checked against a limit
of 0.6 V ± 0.3 V.
611 DC gain x100 failed
This test configures for the 100 mV range.
The dc amplifier gain is set to X100. The measure customer (MC)
input is connected to the internal TSENSE source which produces
0.6 volts. A 20 ms ADC measurement is performed and checked for
a + overload response.
612 Ohms 500 nA source failed
This test configures to the 10 V dc
range with the internal 10 M 100:1 divider A4U102 connected across
the input. the 500 nA Ohms current source is connected to produce a
nominal 5 V signal. A 20 ms ADC measurement is performed and the
result is checked against a limit of 5 V
±
1 V.
613
Ohms 5
µ
A source failed
This test configures the 10 V range with
the internal 10 M 100:1 divider A4U102 connected across the input.
The 5
µ
A current source is connected. The compliance limit of the
current source is measured. A 20 ms ADC measurement is performed
and the result is checked against a limit of 7.5 V
±
3 V.
614
DC 300V zero failed
This test configures the 300 V dc range with
no input applied. A 20 ms ADC measurement is performed and the
result is checked against a limit of 0V ± 5 mV.
6
Chapter 6 Service
Self-Test Procedures
169