4-8
IM 704420-01E
Explanation
You can set the number of measured values (number of events) of the pulse width or
time difference to be stored in the acquisition memory or the period (gate time) over
which the measured values are stored in the acquisition memory.
Selecting the gate
• 10
5
(event gate)
10
5
measured values are stored in the acquisition memory. Of those values, the
measured values that are in the measurement range determined by the
measurement function are used to derive the measurement result (jitter). You
cannot change the number of events.
• 0.1 s, 0.5 s, and MAN (time gate)
[0.1s] and [0.5s] correspond to gate times of 0.1 s and 0.5 s, respectively. [MAN]
allows measurement over the manually specified gate time. For details on “MAN,”
see “Manual setting of the gate time” below.
Manual setting of the gate time
When making measurements using a gate time other than [0.1s] or [0.5s], set the gate
time in the range shown below. When the value can be specified, the [SET] indicator
lights and the gate time is shown on the display.
• Range: 1.0 ms to 1000.0 ms
• Resolution: 0.1 ms
Note
If you set the gate time between 100.1 ms and 1000.0 ms, the measured values are acquired
in units of 100 ms. The measured values are acquired so that the sum of the gate times in
units of 100 ms add up to the specified gate time and determines the jitter (statistical value).
The calculated value is displayed or output as a DC level signal (see section 7.1). The
portion that is less than 100 ms is processed as shown in the following figure. Meter
indication, numeric display, and DC output are updated as shown below.
RF
signal
100 ms
100 ms
100 ms
100 ms
100 ms
100 ms
50 ms
50 ms
Meter indication,
DC output
Example in which the gate time is set to 250 ms
50 ms
RF
signal
100 ms
100 ms
100 ms
100 ms
100 ms
100 ms
50 ms
50 ms
Numeric display
50 ms
4.4 Setting the Gate
