Troubleshooting
9.3 Fault codes (firmware revision 1.05 or earlier)
SITRANS Probe LR with mA/HART
Operating Instructions, 05/2019, A5E32337711-AC
77
29
During a memory check, a problem with the memory has
occurred. Explanation: The device periodically validates
RAM, Flash, and EEPROM memory. If any fault is found,
Fault 29 is displayed. Potential causes are: normal wear
and tear operating outside temperature range other elec-
trical damage
Replace unit.
30
*
The device was unable to get a measurement for the
failsafe timer period.
Check the application and
echo profile, to determine
optimum configuration for
the application, to ensure
the device can obtain a
measurement.
31
*
The device has failed to initialize itself properly.
Reset the device. If the
problem persists, check for
the presence of another
fault and take corrective
action on this fault. If the
problem persists, call the
factory.
32
*
The device is not calibrated. All devices must be fully
calibrated in the factory.
Return device to factory.
34
Failsafe is activated. The output current is set to the fail-
safe behavior. The reason for the failsafe will be indicated
by the presence of at least one other fault.
Determine the other fault
(alternating on the display,
or in the diagnosis/status
word in communication
master) and take corrective
action on that fault.
35
Internal device failure caused by a memory error.
The fault should never ap-
pear. If it does, the device
should reset itself and there
is no action to be taken, It
should be reported to the
factory.
38
*
The internal EEPROM has become corrupted
2)
, or was
not configured properly at the factory.
Replace product
39
*
The internal EEPROM has become corrupted
3)
, or was
not configured properly at the factory.
Replace product
40
*
The internal EEPROM has become corrupted
2)
, or was
not configured properly at the factory.
Replace product
41
*
The internal EEPROM has become corrupted2), or was
not configured properly at the factory.
Replace product
42
*
The device is operating in a low power condition that is
outside its operating range. As a result, a valid measure-
ment has not been taken for the failsafe timer period, and
the device will be put into failsafe mode.
Correct the power supply
(resistance or voltage).
1)
The error will never occur on this device, but is included to complete the list and match
industry standards.
2)
EEPROM can become corrupted due to operating the device outside its operating range
(power and temperature), or other damage.
3)
EEPROM can become corrupted due to operating the device outside its operating range
(power and temperature), or other damage.