CHAPTER 9 TEST FUNCTION
Preliminary User’s Manual A14874EJ3V0UM
233
9.4 Handling of Each Pin in Test Mode
(1) Pins other than those for test mode
(a) Input pins
Input a low level to the VAREQ pin. Special handling is not required for pins other than the VAREQ pin
(handle as in normal mode).
(b) Output pins
Special handling is not required (handle as in normal mode).
(2) Test mode pins (except TBI39 to TBI0, TBO34 to TBO0, BUNRI, TEST, and BUNRIOUT)
Handle the pins for test mode as indicated below.
Connection Method
Pin Name
I/O
When MEMC Is Connected
When Cache Is Connected
When Neither MEMC nor Cache
Is Connected
PHTDOn
Input
Connect to the PHTDOn pin of
the NT85E500.
−
Input low level.
PHTDINn
Output
Connect to the PHTDINn pin of
the NT85E500.
−
VPRESZ
Output
Connect to the VPRESZ pin of
the NT85E500, NT85E502.
Connect to the VPRESZ pin.
VPTCLK
Output
Connect to the VPTCLK pin of
the NT85E500, NT85E502.
Connect to the VPTCLK pin.
TESEN
Output
−
−
PHTEST
Output
Connect to the PHTEST pin of
the NT85E500.
−
TMODEn,
TBREDZ
Output
Leave open.
Leave open.
Remark
n = 1, 0
(3) Precautions when NB85E901 is connected
When the NB85E901 (RCU) is connected to the NU85E, the following pins are used in the unit test mode. All of
these pins should be attached off chip as external pins.
•
TBI39 to TBI0
Note 1
•
DRSTZ
Note 2
•
TBO34 to TBO0
Note 1
•
DMS
Note 2
•
TEST
Note 1
•
DDI
Note 2
•
BUNRI
•
DDO
Note 2
•
DCK
Note 2
•
DBINT
Notes 1, 2
Notes 1.
Can be used as an alternate function pin with a pin used in normal mode.
2.
Pins of the NB85E901 (For details, refer to
CHAPTER 10 NB85E901
.)