351
TEST, TESTP, DTEST, DTESTP
1
2
3
4
4
6
7
8
7.4
B
it pr
ocessing instru
ctions
7.4.2
T
EST,
TESTP, DTEST, DTES
TP
Function
TEST
(1) Fetches bit data at the location designated by within the word device designated by , and writes it to the bit device
designated by .
(2) The bit device designated by is OFF when the relevant bit is "0" and ON when it is "1".
(3) The position designated by indicates the position of an individual bit in a 1-word data block (0 to 15). When 16 or
more is designated at , the target is the bit data at the position indicated by the remainder of n / 16. For example, when
n 18, the target is the data at b2 since the remainder of 18 / 16 1 is "2".
DTEST
(1) Fetches bit data at the location designated by within the 2-word device designated by , or +1, and writes it to the
bit device designated by .
(2) The bit device designated by is OFF when the relevant bit is "0" and ON when it is "1".
(3) The position designated by indicates the position of an individual bit in a 2-word data block (0 to 31). When 32 or
more is designated at , the target is the bit data at the position indicated by the remainder of n / 32. For example, when
n 34, the target is the data at b2 since the remainder of 34 / 32 1 is "2".
Operation Error
(1) There is no operation error in the TEST(P) or DTEST(P) instruction.
Program Example
(1) The following program turns M0 ON or OFF based on the status of the 10th bit in the 1-word data block (D0).
[Ladder Mode]
[List Mode]
[Operation]
S2
S1
D
D
S2
S2
bit
b15
b0
b5
S1
D
S2
S2
(W
hen =5
)
S2
S1
S1
D
D
S2
S2
S1
D
b15
b0
b31
b16
b21
S1 +1
bit
S2
S2
(W
hen =21
)
Step
Instruction
Device
1 0 1 1 0 0 1 1 0 1 1 0 1 0 1 0
D0
b0
b15
b10
T
urns
M0
O
FF
s
i
nce
b10
i
s
"
0
."
0 0 1 0 0 1 1 1 1 0 1 0 0 0 0 1
D0
b0
b15
b10
T
urns
M0
O
N
s
i
nce
b10
i
s
"
1
."