Rev. 3.0, 10/02, page 421 of 686
(1) EXTEST
The EXTEST instruction is used to test external circuits when this LSI is installed on the print
circuit board. If this instruction is executed, output pins are used to output test data (specified
by the SAMPLE/PRELOAD instruction) from the boundary scan register to the print circuit
board, and input pins are used to input test results.
(2) SAMPLE/PRELOAD
The SAMPLE/PRELOAD instruction is used to input data from the LSI internal circuits to the
boundary scan register, output data from scan path, and reload the data to the scan path. While
this instruction is executed, input signals are directly input to the LSI and output signals are
also directly output to the external circuits. The LSI system circuit is not affected by this
instruction.
In SAMPLE operation, the boundary scan register latches the snap shot of data transferred
from input pins to internal circuit or data transferred from internal circuit to output pins. The
latched data is read from the scan path. The scan register latches the snap data at the rising
edge of the TCK in Capture –DR state. The scan register latches snap shot without affecting
the LSI normal operation.
In PRELOAD operation, initial value is written from the scan path to the parallel output latch
of the boundary scan register prior to the EXTEST instruction execution. If the EXTEST is
executed without executing this RELOAD operation, undefined values are output from the
beginning to the end (transfer to the output latch) of the EXTEST sequence. (In EXTEST
instruction, output parallel latches are always output to the output pins.)
(3) CLAMP
When the CLAMP instruction is selected output pins output the boundary scan register value
which was specified by the SAMPLE/PRELOAD instruction in advance. While the CLAMP
instruction is selected, the status of boundary scan register is maintained regardless of the TAP
controller state. BYPASS is connected between TDI and TDO, the same operation as BYPASS
instruction can be achieved.
(4) HIGHZ
When the HIGHZ instruction is selected, all outputs enter high-impedance state. While this
instruction is selected, the status of boundary scan register is maintained regardless of the TAP
controller state. BYPASS resistor is connected between TDI and TDO, the same operation as
BYPASS instruction can be achieved.
(5) IDCODE
When the IDCODE instruction is selected, IDCODE register value is output to the TDO in
Shift-DR state of TAP controller. In this case, IDCODE register value is output from the LSB.
During this instruction execution, test circuit does not affect the system circuit. INSTR is
initialized by the IDCODE instruction in Test-Logic-Reset state of TAP controller.
(6) BYPASS
The BYPASS instruction is a standard instruction necessary to operate bypass register. The
BYPASS instruction improves the serial data transfer speed by bypassing the scan path.
During this instruction execution, test circuit does not affect the system circuit.
Содержание H8S/2215 Series
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