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Nano-CXP Specifications
Genie Nano-
CXP Series™
Defective Pixel Specification for Models 5100/4090
These defective pixel specifications in the following table are as published by the sensor
manufacturer. Genie Nano cameras apply defective pixel corrections to improve the camera
performance.
Defective Pixels
(max: 1000)
Number of defective pixels allowed in the full window size of 5120 x 5120
(i.e. model 5100).
For mono devices: A defective pixel is defined as a pixel which has a response that
deviates 102 LSB10 in a dark image or a corrected gray image, or a saturated image,
from the local median of the neighboring pixels in a 7 x 7 block.
The defective pixels in dark, gray and saturated images are stored a in a global defect
map. The limit is applied to the global defect map.
Defective Column
0 defective columns allowed
Number of defective columns in the full window size of 5120 x 5120 derived from dark,
half scale and saturated image.
For Mono devices: A bad column is defined as a column which has a response that
deviates 48 LSB10 in a dark image, or a corrected gray or a saturated image, from the
local median of 11 neighboring columns (+/- 5 left/right columns).
Defective Row
0 defective rows allowed
Number of defective rows in the full window size of 5120 x 5120 derived from dark,
half scale and saturated image.
For Mono devices: A bad row is defined as a row which has a response that deviates 48
LSB10 in a dark image, or a corrected gray or a saturated image, from the local
median of 11 neighboring rows (+/- 5 top/bottom rows).
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