Genie Nano-
CXP Series™
Nano-CXP Specifications
•
13
Mean Time between Failure (MTBF)
The analysis was carried out for operating temperatures varying from -40 to 100ºC. The following
table presents the predicted MTBF and Failure Rate Values (
FIT
).
*FIT
calculations are based on the Bellcore/Telcordia SR-332
—
Method 1
—
Case 3 standards.
Camera Assembly
Temperature (°C)
MTBF (hours)
MTBF (years)
Failure Rate (FIT)
*
-40
15,401,201
1,758
64.93
-20
9,292,817
1,061
107.61
0
4,770,992
545
209.6
20
2,066,329
236
483.95
40
812,486
93
1230.79
60
315,604
36
3168.53
80
127,279
15
7856.77
100
54,362
6
18395.1
MTBF versus temperature shown graphically
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