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Chapter 3
87
Troubleshooting
Service Screen
3. Rotate the knob and select
SERVICE
.
The SERVICE screen appears. For field descriptions, see
“Field Names
and Descriptions” on page 87
.
Field Names and Descriptions
Voltmeter Connection
This field selects the desired circuit node for voltage measurements. To
change the voltmeter connection, use the knob to select the
Voltmeter
Connection
field. A
Choices
menu will appear. Move the cursor to the
desired circuit node in the list and push the cursor control knob. The
reading is displayed in the
Voltage
measurement field at the top- left
of the display.
Because the nodes being measured must be in the range of 0 to ±5 volts,
the measurement of some points are scaled to that measurement range.
For example; the +12 Volt reference (
MEAS_12V_REF)
should measure
about +5volts. The
−
12 Volt reference (
MEAS_NEG_12V_REF)
should
measure about
−
5 volts. Many of the voltage measurements are only
valid after a number of instrument settings are changed.
When run, the diagnostic routines make the necessary circuit changes
and measurements automatically, comparing the measurements to
known limits for each node.
Counter Connection
This field selects the desired circuit node to connect to the Test Set’s
internal frequency counter. The reading is displayed in the
Frequency
measurement field at the top right of the display.
To change the counter connection, use the knob to select the
Counter
Connection
field. A
Choices
menu will appear. Select the desired
circuit node.
Gate Time
This field is used to adjust the Test Set’s internal frequency counter’s
gate time. A shorter gate time may enable you to see frequency
fluctuations that might not be seen using a longer gate time.
To change the gate time, use the knob to select the Gate Time field.
When you select the field a flashing >> cursor is displayed. Rotate the
cursor control knob until the desired gate time (10 to 1000 ms in 10 ms
increments) is displayed, then press the cursor control knob.
Содержание 8935 Series
Страница 34: ...34 Chapter 1 General Information Trademark Acknowledgements...
Страница 35: ...35 2 Product Information This chapter contains general information about the Test Set and how to service it...
Страница 93: ...92 Chapter 3 Troubleshooting Product Verification...
Страница 102: ...101 5 Disassembly This chapter explains how to disassemble the Test Set for major assembly replacement...
Страница 115: ...114 Chapter 5 Disassembly A2 Disassembly Figure 5 9 PC Board Assemblies...
Страница 135: ...134 Chapter 5 Disassembly Wire Cable Information...
Страница 139: ...138 Chapter 6 Replaceable Parts Parts Identification Covers and Chassis Parts Figure 6 2 External and Internal Covers...
Страница 150: ...Chapter 6 149 Replaceable Parts Parts Identification Figure 6 14 Cables Panel and Bottom Side Views...
Страница 157: ...156 Chapter 6 Replaceable Parts Parts List...
Страница 158: ...157 7 Periodic Adjustments This chapter contains the periodic adjustment procedures for the Test Set...
Страница 173: ...172 Chapter 7 Periodic Adjustments Eb No Calibration Program Description...
Страница 233: ...232 Chapter 8 Performance Tests CDMA Analyzer Modulation Accuracy Performance Test 29...
Страница 283: ...282 Chapter 9 Performance Test Records CDMA Analyzer Modulation Accuracy Performance Test 29 Record...
Страница 321: ...320 Chapter 10 Block Diagrams Instrument Control Section...
Страница 322: ...321 A Error Messages...
Страница 337: ...336 Appendix A Error Messages Non Recoverable Firmware Error...