X-Rite 500 Series, Operator'S Manual

Page: 111 / 124

I N S T R U M E N T F U N C T I O N S
5-57
To set options:
1.
With the EFS Options menu displayed, press the Tab
Up key
$
or Tab Down key
@
to highlight
OP
Setting
,
Ref 3 Setting
, or
Mode
option.
2.
Press the Enter key
#
to access editor.
3.
Use the Tab keys
$@
to move the highlight to desired
setting.
4.
Press the Enter key
#
to select highlighted setting.
5.
Repeat steps 1 through 4 for additional options.
6.
After edits are complete, press the Escape key
!
to
return to the EFS function.
NOTE: The option selected will revert back to its original settings if
the Enter key
#
is not used to exit the editor.
Measuring Samples
For “smart” recognition and optimal calculations of
samples in EFS mode, the instrument has to contain
values for paper and VCMY solids.
To measure Den, Dot, PC, Trap, and H/G samples in EFS:
1.
Center the target window on paper sample. Lower
unit to target window and hold closed. Once
measurement data is displayed, release the unit.
2.
Dot or PC
Measure VCMY solid patches and corresponding
tints. For Dot, data appears as dot area or dot gain
(refer to dot function earlier in this section).
Trap or H/G
Measure overprint patch. For trap, the instrument
initiates a multiple measurement sequence (refer to
trap function earlier in this section).
To measure Color samples in EFS:
1.
Center the target window on overprint sample. Lower
unit to target window and hold closed. Once color
measurement data is displayed, release the unit.