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Chapter 23
On-Chip Debug Function (OCD)
User’s Manual U16580EE3V1UD00
23.3 Precautions
<1> The flash memory of the device used in debugging is rewritten during debugging, so the number
of flash memory rewrites cannot be guaranteed. Therefore, do not use the device used in
debugging for a mass production product.
<2> If a reset (RESET signal input from the target system or reset input by an internal reset source)
occurs during RUN (program execution), the break function may malfunction.
<3> Even if reset is masked by using the mask function, the I/O buffers (port pins, etc.) are set to the
reset state when the RESET signal is input.
<4> RESET signal input during a break is masked.
Summary of Contents for MuPD70F3187
Page 6: ...6 Preface User s Manual U16580EE3V1UD00 ...
Page 16: ...16 User s Manual U16580EE3V1UD00 ...
Page 28: ...28 User s Manual U16580EE3V1UD00 ...
Page 32: ...32 User s Manual U16580EE3V1UD00 ...
Page 84: ...84 Chapter 2 Pin Functions User s Manual U16580EE3V1UD00 MEMO ...
Page 144: ...144 Chapter 3 CPU Functions User s Manual U16580EE3V1UD00 MEMO ...
Page 312: ...312 Chapter 9 16 Bit Timer Event Counter P User s Manual U16580EE3V1UD00 MEMO ...
Page 534: ...534 Chapter 11 16 bit Timer Event Counter T User s Manual U16580EE3V1UD00 ...
Page 969: ...969 Chapter 20 Port Functions User s Manual U16580EE3V1UD00 MEMO ...
Page 970: ...970 Chapter 20 Port Functions User s Manual U16580EE3V1UD00 ...
Page 976: ...976 Chapter 22 Internal RAM Parity Check Function User s Manual U16580EE3V1UD00 MEMO ...
Page 984: ...984 Chapter 23 On Chip Debug Function OCD User s Manual U16580EE3V1UD00 MEMO ...
Page 1006: ...1006 Chapter 24 Flash Memory User s Manual U16580EE3V1UD00 MEMO ...
Page 1036: ...1036 Chapter 27 Recommended Soldering Conditions User s Manual U16580EE3V1UD00 MEMO ...
Page 1046: ...1046 Appendix A Index User s Manual U16580EE3V1UD00 MEMO ...
Page 1052: ...1052 User s Manual U16580EE3V1UD00 ...
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