Revision 1.5
Integrated Device Technology, Inc.
CPS-16/12/8 User Manual
6 - 1
July 10, 2012
Chapter 6
JTAG & Boundary Scan
6 JTAG & BOUNDARY SCAN
The CPS supports all the mandatory instructions defined in the IEEE 1149.1 specification. To support
production testing, the device supports private instructions for Memory BIST and Scan Testing. The TAP
controller allows access to the configuration registers. Boundary scan testing of the AC-coupled IOs are
performed in accordance with IEEE 1149.6 (AC Extest).
This chapter covers the overall functionality of the JTAG TAP port interface and Configuration Registers
Access (CRA) capability. For the full specification, please refer to the device’s datasheet.
6.1 JTAG AND AC EXTEST COMPLIANCE
All DC pins are in full compliance with IEEE 1149.1. All AC-coupled pins fully comply with IEEE 1149.6. All
1149.1 and 1149.6 boundary scan cells are on the same chain. No additional control cells are provided for
independent selection of negative and / or positive terminals of the Tx or Rx pairs.
6.2 TEST INSTRUCTIONS
The CPS-16/12/8’s JTAG functionality does not support register access when it is part of a chain,
and must be the only device on the JTAG bus when its registers are accessed using JTAG
interface.
Table 6.1 Test Instructions
IR Code [3:0]
Instruction
Comments
0x0
Ex_Test
Implemented per IEEE 1149.1-2001
0x1
Sample/Preload
Implemented per IEEE 1149.1-2001
0x2
ID Code
Implemented per IEEE 1149.1-2001
Device ID = 0x35B (CPS-16)
Device ID = 0x25C (CPS-8)
0x3
High Z
Implemented per IEEE 1149.1-2001
0x4
Clamp
Implemented per IEEE 1149.1-2001
0x5
Ex_Test Pulse
Implemented per IEEE 1149.6
0x6
Ex_Test Train
Implemented per IEEE 1149.6
0x7
Reserved
0x8
Reserved
0x9
Reserved
0xA
Configuration Register
Access
Read and Write Access to Configuration Register space
0xB
ISCAN
Enables internal Scan for production test
0xC
Reserved
0xD
Reserved