DFX-7
Ultrasonic Flaw Detector
65
E.
Gate
– An electronic feature that allows the user to monitor signals inside the
boundaries of the gate settings. The height of the gate from the baseline is
known as the threshold, and controls the sensitivity of the reflections that
trigger a detection from the opposite surface of the material.
F.
Measurement Scale
– Represents thickness values over a defined
measurement range, and labeled at the calibrated hash marks on the display
(X) axis.
G.
Digital Material Thickness Value
– The thickness of the base material.
H.
Minimum Thickness Value
– Dynamically updates the value during a scan,
and displays the minimum thickness value found. Note: Only visible when
high speed scan mode is enabled.
I.
Units
– The current measurement units being used (English, Metric).
J.
Velocity
– The material velocity value the
CMX
DL
is currently using or
calibrated for. Displayed in either English or Metric units, depending on what
units the gauge is set for.
K.
RF waveform
– The sine wave created by the reflected sound, or oscillation,
from the material being measured. The both the positive and negative half
cycles (full cycles) are displayed.
L.
Coating Thickness Value
– Displays the actual thickness of any coating
adhered to a metallic material surface (PECT Mode), or a coating adhered to a
non-metallic surface (CT Mode).
M.
Minimum Thickness Value
– Dynamically updates the value during a scan,
and displays the minimum thickness value found. Note: Only visible when
high speed scan mode is enabled.
N.
Feature Status Bar
- Indicates the features currently enabled and in use in
the following order:
•
Measurement Mode (P-E, PECT, PETP, E-E, COAT)
•
Differential Mode (ON/OFF)
•
High Speed Scan Mode (ON/OFF)
•
Alarm Mode (ON/OFF/AUDIBLE)
•
Gain Setting (VLOW, LOW, MED, HI, VHI)
