Programmer’s Model for Test
4-2
Copyright © 2003, 2004. ARM Limited. All rights reserved.
ARM DDI 0306B
4.1
Scan testing
The IPCM enables:
•
the automatic insertion of scan test cells
•
the use of
Automatic Test Pattern Generation
(ATPG).
This is the recommended method of manufacturing test.
During scan testing, ensure that the
SCANENABLE
signal is driven HIGH. For normal
use ensure that
SCANENABLE
is driven LOW.
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