Agilent Technologies Agilent E5250A, User Manual

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Agilent E5250A User’s Guide, Edition 11 9-29
Executing Sample Programs
HCI Measurement Program
To Execute HCI Test Program
1. Load the HCI test program (SP_MUX in this example), and press RUN function
key. Then the following message is displayed on the computer screen.
Enter directory name for saving data. (default: test_data)
2. Type the name of directory for saving HCI test data, and press
ENTER
key. After
executing the program, test data is saved to the directory in the diskette. If you
press
ENTER
key with no input, the test data will be saved in "test_data"
directory.
After this operation, the Ib-Vgs measurement is automatically executed, and the
measurement results are displayed on the 4155/4156, as shown in Figure 9-6.
Also the program automatically extracts the gate stress voltage (
Vgstr
), which
will be used later for stress testing.
3. Remove the device used to determine
Vdstr
and
Vgstr
after the following
message is displayed.
"Connect HCI degradation test devices"
This device must be Device1, which was connected to the E5255A output port
numbers 1, 25, 49, and GNDU as shown in Figure 9-4.
4. Connect a new device in place of device removed by previous step. Then press
Continue function key to continue the program.
The program executes the leakage current tests, which determine the valid
devices to use for stress testing.
If the measured leakage currents are within the limit, following message is
displayed:
"Device No. = XX can be used"
If the measured leakage currents are not within the limit, following message is
displayed:
"Device No. = XX shall not be used"
Then, the initial characterization (before stress) is performed for all valid
devices.
Then, stress/interim characterization cycle is executed until stress termination
conditions are met as described previously. In each interim characterization,
Idlin
,
Gmmax
,
Vtext
, and
Vtci
are determined. An example measurement
is shown in Figure 9-7.