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Glossary
Glossary–4
DAS System User Manual
Acquisition
The capturing of data from a system under test by a logic analyzer. Data is
conditionally stored in acquisition memory in preparation for formatting by
the user. (Data may be clocked into the logic analyzer, yet qualified out
before it can be stored in acquisition memory.) Use the trigger menu of the
appropriate acquisition module to specify whether or not data is stored.
Acquisition Clock
The clock, internal to the logic analyzer, that loads acquired data into the
acquisition memory. This clock can be derived from an internal source
(asynchronous to the system under test) or from an external source (synchro-
nous to the system under test).
Acquisition Cycle
A complete data acquisition sequence including start, search, capture, and
stop phases.
Acquisition Memory
The RAM located on each acquisition card where data from an acquisition is
stored.
Acquisition Memory Sequence
A single sample of acquired data to which a unique identification number is
assigned. As data is acquired, each sample is assigned a consecutive
sequence number.
Active Module
The module highlighted by the cursor in the Menu Selection overlay.
Address
A number or expression that designates a specific location in a storage or
memory device.
Algorithmic Pattern Generator
A programmable pattern generator (like the 92S16) that provides storage for
data vectors and control flow instructions. Algorithmic pattern generators
can be programmed to branch, loop, and perform subroutine calls. By using
internal registers and control flow instructions, algorithmic pattern genera-
tors can use a relatively small vector memory and still provide an unlimited
number of vectors. The 92S16 algorithmic pattern generator can also
perform conditional branches based on signals received from the circuit
under test. (See also 92S16.)
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