4.21 Continuous Test Function
114
4.21.1 Control Screen Sequence
114
4.21.2 Details of the Setting Process
115
4.22 External DC Bias Setting
118
4.22.1 Control Screen Sequence
118
4.22.2 Details of the Setting Process
119
4.23 Setting the Number of Displayed Digits
120
4.23.1 Control Screen Sequence
120
4.23.2 Details of the Setting Process
121
4.24 Setting for Display
122
4.24.1 Control Screen Sequence
122
4.24.2 Details of the Setting Process
123
4.25 Key Lock Function
124
4.25.1 Turning the Key Lock On and Off
124
Chapter 5 Applications
125
5.1 Example of Comparator Application
125
5.2 Testing High Impedance Elements
127
5.3 Testing an Element in a Circuit
128
5.4 External Interference
129
5.4.1 Countermeasures Against Interference from the
Power Supply Line
129
5.4.2 Countermeasures Against Noise from the Test
Cables
131
5.5 The EXT I/O Connector
132
5.5.1 Pinouts for the EXT I/O Connector
133
5.5.2 Signal Lines for the EXT I/O Connector
134
5.5.3 Circuit Construction and Connections for the EXT I/O
Connector
136
5.5.4 Electrical Characteristics of the Output Signals
137
5.6 Testing Using EXT I/O
138
5.6.1 Normal Testing
138
5.6.2 Continuous Testing From EXT I/O
140
5.7 Supplying DC Bias
145
5.7.1 How to Supply a DC Bias Voltage
145
5.7.2 How to Supply a DC Bias Current
147
5.8 The Residual Charge Protection Function
148
5.9 9442 PRINTER (option)
149
5.9.1 Preparation
149
5.9.2 Connection Method
151
5.9.3 Control Screen Sequence
152
Содержание 3522-50
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