Hioki 3522-50, Инструкция по эксплуатации

Страница: 189 / 204

175
────────────────────────────────────────────────────
7.3 Time Taken for Testing
────────────────────────────────────────────────────
Range Frequency
1 DC
2 0.001 Hz to 0.100 Hz
3 0.101 Hz to 4.000 Hz
4 4.001 Hz to 100.0 Hz
5 100.1 Hz to 2.000 kHz
6 2.001 kHz to 10.00 kHz
7 10.01 kHz to 100.0 kHz
Range Test signal level
1 0.010 V to 0.200 V
2 0.201 V to 0.500 V
3 0.501 V to 1.000 V
4 1.001 V to 2.000 V
5 2.001 V to 2.500 V
6 2.501 V to 5.000 V
Wait time for changing test conditions
When the test conditions are changed, the time taken for the internal
processing is necessary according to the following factors (1) to (4), before
testing.
If the several factors occur the wait time, the longest time is taken among
the factors.
(1) When the test frequency is changed:
Changing to the frequency in another range Wait time: 300 ms
Changing the frequency through 100.1 Hz Wait time: 1s
Example: When the test frequency is changed from 10 Hz to 1 kHz, the wait
time is 1s.
(2) When the test signal level is changed:
Changing to the test signal level in another range Wait time: 300 ms
Example: When the test signal level is changed from 1 V to 1.001 V, the
wait time is 300 ms.
Note: When the test signal level setting is CV/CC or the setting of voltage
and current limit is ON, the test signal level is automatically
changed.
(3) When the test range is changed:
There are cases in which a 300 ms wait is entered.
(4) When the setting for external DC bias is changed:
There are cases in which a 300 ms or a 1 s wait is entered.