Calibration
Fine-tuning for X-Y Calibration
Rev. D
Dimension 3100 Manual
329
17.7.4 Measure Horizontally at 150 V Scan Size
1. Verify that the
Scan angle
is set to
0.00
degrees, and that
Units
(
Other Controls
panel) is
set to
Volts
.
2. Set the
Scan size
parameter on the
Scan Controls
panel to one-third the maximum (
150V
).
3. Select two widely-spaced features on the sample image of known separation, then use the
mouse to draw a horizontal line between them.
Note:
For example, on a 10µm, silicon reference, draw the line from the left side of
one pit to the left side of another pit as far away as possible. The microscope
displays the measured distance next to the line.
4. Verify that the microscope’s measured distance agrees with the known horizontal distance.
5. If there is significant disagreement between the two, fine-tuning is required; go to the next
step. If the displayed distance agrees with the known distance, skip to
6. Perform fine-tuning adjustments using either trial and error or calculate the precise
correction (see
).
Trial and Error Method
1. Select the
Realtime
>
Microscope
>
Calibrate
>
Scanner
function to display the
Scanner
Calibration
dialog box.
2. Select the
X fast derate
parameter or
Y slow derate
for Y-axis adjustment.
3. If the measured distance is less than the actual distance, decrease the
X fast derate
parameter
slightly or
Y slow derate
for Y-axis adjustment and re-measure image features.
4. Adjust deratings up or down until measurements accord with known feature distances.
Calculation Method
1. Select
Realtime
>
Microscope
>
Calibrate
>
Scanner
to display the
Scanner Calibration
dialog box.
2. Record the
X fast derate
or
Y slow derate
value.
3. Perform the following calculation where
s
is the
X fast sens
or
Y slow sens
value;
a
is the
actual distance;
d
is the
X fast derate
or
Y slow derate
value you recorded in the above step;
m
is the measured distance; and,
v
is the
Scan size
in volts:
s
a
m
----
s
d 440
v
–
(
)
–
[
]
⋅
–
440
v
–
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Summary of Contents for Dimension 3100
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