Veeco Dimension 3100, Manual

Page: 227 / 376

Force Imaging
Force Calibration Mode
Rev. D Dimension 3100 Manual 207
Figure 13.2b Piezo Travel in Force Calibration Mode
As the piezo moves the tip up and down, the cantilever-deflection signal from the photodiode is
monitored. The force curve, a plot of the cantilever deflection signal as a function of the voltage
applied to the piezo tube, displays on the display monitor. The control panel detailing parameters
for controlling the microscope in
Force Calibration mode displays on the control monitor.
Force Calibration mode is frequently used to adjust and calculate contact forces between the
cantilever and the sample. Other uses of Force Calibration mode include characterization of the
forces on the cantilever tip, diagnosing AFM performance, and determination of the sensitivity of
the cantilever deflection voltage in terms of voltage applied to the piezo. If used correctly,
Force
Calibration mode provides a variety of useful information.
Z Piezo
Sample
(Distance fixed
Retracted Extended
by head height)
A B
Z Scan Start
Ramp Size
A : Z = Z Scan Start - Ramp Size
B : Z = Z Scan Start