SERVICE CALL CONDITIONS
20 June 2005
4-6
ID sensor, pattern edge detect error
352 D
The ID sensor pattern edge voltage is
detected to be not 2.5V twice
consecutively during an 800 ms
interval.
•
ID sensor defective
•
ID sensor connector defective
•
Poor ID sensor connector connection
•
I/O board (IOB) defective
•
High voltage supply board defective
•
Dirty ID sensor
•
Defect at the ID sensor pattern
writing area of the drum
ID sensor, LED current abnormal at
initialization
353 D
One of the following ID sensor output
voltages is detected at ID sensor
initialization.
1) Vsg < 4.0V when the maximum
PWM input (255) is applied to the
ID sensor.
2) Vsg
≥
4.0V when the minimum
PWM input (0) is applied to the ID
sensor.
•
ID sensor defective
•
ID sensor harness defective
•
ID sensor connector defective
•
Poor ID sensor connection
•
I/O board (IOB) defective
•
Exposure system defective
•
High voltage supply board defective
•
Dirty ID sensor
ID sensor timeout abnormal at
adjustment
354 D
Vsg falls out of the adjustment target
(4.0
±
0.2V) at the start of Vsg checking
after 20 seconds
•
ID sensor defective
•
ID sensor harness defective
•
ID sensor connector defective
•
I/O board (IOB) defective
•
Exposure system defective
•
Poor ID sensor connector connection
•
High voltage supply board defective
•
Dirty ID sensor
TD sensor error: Test value abnormal
390 D
The TD sensor output voltage is less
than 0.5V or more than 5.0V after 10
consecutive times during copying.
•
TD sensor defective
•
TD sensor not connected or
connector damaged
•
Poor connection between the TD
sensor and the I/O board (IOB)
•
I/O board (IOB) defective
•
Toner supply defective
TD sensor error: Auto adjust error
391 D
During automatic adjustment of the TD
sensor, output voltage is less than 1.8V
or more than 4.8V during TD sensor
initial setting.
•
TD sensor abnormal
•
TD sensor disconnected
•
Poor TD sensor connection
•
I/O board (IOB) defective
•
Toner supply defective
Development output abnormal
395 D
A development bias leak signal is
detected. High voltage output to the
development unit exceeded the upper
limit (65%) for 60 ms.
•
High voltage supply board defective
•
Poor connection at the development
bias terminal
•
Poor connection at the high voltage
supply board
Transfer roller leak detected
401 D
A transfer roller current leak signal is
detected.
•
High voltage supply board defective
•
Poor cable connection or defective
cable
•
Transfer connector defective