Keba KeTop T100, User Manual, Page: 144 / 163

●
Ignition impulses of fluorescent lamps
●
Switching procedures on inductive electrical circuits
●
Contact bounces when closing or opening make-and-break contacts
●
Voltage fluctuations on heavy load switching procedures
There is a series of test standards for the above listed sources of interference,
intentionally or unintentionally caused by technical systems, which simulate
this interference:
●
IEC 61000-4-3 High Frequency Electromagnetic Field Immunity Test
●
IEC 61000-4-4 Electrical Fast Transient / Burst Immunity Test
●
IEC 61000-4-6 Test of Immunity to Conducted Disturbances, Induced by
High Frequency Fields
●
IEC 61000-4-8 Power Frequency Magnetic Field Immunity Test
●
IEC 61000-4-11 Voltage Dips, Short Interruptions and Voltage Variations
Immunity Test
All the international Standards listed here are also available as European
Standards. The Product Standard IEC 61131-2 demands testing to these
Standards and also defines the severity level.
14.3.1.4 Technical systems as interference sinks
In the case of functional interference, EMC problems first arise at interference
sinks. The following interference sinks can be identified dependent on the de-
gree of immunity to electromagnetic influences:
Immunity Interference sinks
max
min
Transformers
Circuit breakers, contactors
Relays
Power transistors
Transistor circuits
Integrated switching circuits
Tab.14-5: Examples for technical systems as interference sinks
Control systems without integrated switching circuits are unthinkable and
would therefore not be sufficiently immune without suitable EMC measures.
CE Conformity, Directives and Standards KeTop T50VGA
© KEBA 2009
User's Manual V1.50 144