Evaluation Board Manual
Preliminary
PPC750FX Evaluation Board
750FXebm_ch10.fm
June 10, 2003
Connectors
Page 69 of 115
10.12 Test Connections
Access to selected points in the board circuits, not available through connectors or jumpers, is provided by
small test connections. All of the test connections are small pads with a center hole. An electrical connection
can be made to any of these test connections for test purposes. These test connections are documented in
the schematic, in
Table 10-13, and in Figure 10-13.
There are two kinds of test connections. The basic difference between the two is the size of the pad and the
center hole. One type of test connection is called a
test point and has a large pad and center hole. Test points
are suitable for soldering wires to them for test and design purposes. The reference designators for test
points are TPnn where nn are numbers. The other type of test connection is called an
ehole or test access
via. These test connections have a very small pad and center hole. The reference designators for eholes are
Unn where nn are numbers.
To determine what signal the test connection connects to, refer to the schematic. In
Figure 10-13, the test
connections are labeled with their reference designators only. The actual pad and hole is not shown. Other
major components on the board are shown for assistance in locating the test connections.
Table 10-13. Test Connections
Location
Component
Signal
TP1
U20
LBOOT_CS_N
TP2
U20
LDEV_RW_N
TP3
U18 +2.5 V
VADJ
TP4
U50
P07
TP5
U50
INT_N
TP6
U3 System Controller
CS2_N
TP7
U3 System Controller
CS3_N
TP8
U3 System Controller
JTD0
TP9
U1 750FX
QREQ0
TP10
U50
P17
TP11
U3 System Controller
MPP13
TP12
U1 750FX
WTI
TP13
U3 System Controller
MPP16
TP14
U3 System Controller
MPP15
TP15
U1 750FX
CI
TP16
U3 System Controller
DEVDP0
TP17
U1 750FX
RSRV0
TP18
U3 System Controller
MPP18
TP19
U3 System Controller
MPP17
TP20
U3 System Controller
DEVDP1
TP21
U1 750FX
CLK_OUT0
TP22
U3 System Controller
DEVDP3
