Hioki ST4030, Instruction Manual, Page: 230 / 256

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Circuit Configuration
15.2 Circuit Configuration
Circuit operations during tests
A overview of the internal circuit of the instrument is shown below.
100 V
-
3300 V
to
The circuit operations after testing starts are as described below.
1
The detection circuit gain is set automatically according to the output voltage.
2
The set DC voltage (100 V to 3300 V) is generated by the booster circuit using switching.
3
The DC voltage that is generated is fed to a 10 nF capacitor.
4
Leave enough time for the capacitor voltage to reach the set voltage, and then turn ON the
switch.
5
The load stored in the capacitor is applied to the workpiece to be tested via output
resistance and a diode.
6
When the stored load is exhausted, the internal capacitor and workpiece to be tested are
separated by the diode.
7
Detects the attenuating oscillation waveform of the workpiece being tested.
When testing is finished, the switch turns OFF.