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129
Self-test Function
ROM/RAM test
Checks the instrument internal memory (ROM and RAM).
(Measurement screen)
[SYSTEM]
>
[TEST]
1
2
1
Tap
[EXEC]
.
2
Tap
[EXEC]
.
The test will start automatically (approx. 90 sec.).
When the test has finished, the test results will be displayed to the right of
[FAST]
.
PASS
All ROM/RAM memories are normal.
NG
One or more of the ROM/RAM memories is abnormal.
IMPORTANT
•
All instrument operations are disabled during ROM/RAM tests.
•
If the judgment results display is
[NG]
, repairs are necessary. Contact your authorized Hioki distributor or
reseller.
9
System Settings
Summary of Contents for ST4030
Page 2: ......
Page 14: ...6 Usage Notes ...
Page 32: ...24 Inspecting before Measurement and Verifying Operations ...
Page 42: ...34 Table Copying ...
Page 108: ...100 Setting Dielectric Break down Judgment Conditions ...
Page 132: ...124 Terminal Open Error Setting ...
Page 198: ...190 Editing Files and Folders ...
Page 214: ...206 Interface Specifications ...
Page 248: ...240 Precautions when Processing Test Leads ...
Page 252: ...244 Index ...
Page 253: ......
Page 254: ......
Page 255: ......
Page 256: ......