Gossen MetraWatt SECULIFE ST PRO, Manual, Page: 39 / 114

GMC-I Messtechnik GmbH 39
Setting Measuring Parameters for RINS Test Sequence
Attention!
!
Prerequisite for Testing
The measurement of insulation resistance may not be
conducted on protection class I devices which have not
passed the protective conductor resistance test.
Note
The insulation test cannot be performed for all DUTs, for
example electronic devices, EDP equipment, medical
devices etc. Leakage current measurements must be
performed for these DUTs (see section 8.7).
Observe the notes in the service instructions.
Attention!
!
In order to prevent damage to the instrument, measure-
ment of insulation resistance may only be performed be-
tween applied parts, measurement inputs or interfaces
and the protective conductor or the housing if the instru-
ment is laid out for measurements of this type.
Attention!
!
Touching the DUT During Measurement
Testing is conducted with up to 500 V, and although cur-
rent is limited (I < 3.5 mA), if the DUT is touched electrical
shock may occur which could result in consequential ac-
cidents.
Attention!
!
Switch Settings at the DUT
All switches at the DUT must be set to the on position
during measurement of insulation resistance, including
temperature controlled switches and temperature regula-
tors as well.
Measurement must be performed in all program steps
for devices equipped with program controllers.
➭
Set the rotary switch to the R
INS
position.
➭
Select the measurement type:
– By setting the parameters
or
– Directly via the
Measurement Type key
➭
In the case of measurement type APP:
Additionally select the respective applied parts by set-
ting the utilized sockets to “on” and the unused sockets
to “off”.
➭
Connect the DUT to the test socket.
➭
In the case of measurement type APP: Connect the applied
parts.
➭
Start the test: press the START /STOP key.
➭
Switch the device under test on.
Note
The measurement is disabled if a voltage of greater than
25 V is measured between the terminals.
➭
The measured values are displayed. The measured
value recording symbol shown at the right appears.
Each time this key is pressed, the currently displayed
measured value is saved to buffer memory.
➭
Turn off the device under test.
Measuring
Parameter Meaning
Measurement Type Suitable for
DUT Connection via
LN(TS)-PE(TS) PC I: Testing is conducted be-
tween short-circuited LN mains
terminals at the test socket and
the DUT’s PE terminal. Test socket, EL1, VL2E,
AT3 adapter (AT3-IIIE, AT3-IIS,
AT3-IIS32), AT16DI/AT32DI,
CEE Adapter
LN(TS)-P1 Testing is conducted between
short-circuited LN mains termi-
nals at the test socket and test
probe P1. Test socket, VL2E,
AT3 adapter (AT3-IIIE, AT3-IIS,
AT3-IIS32), AT16DI/AT32DI,
P1 – P2 2-pole measurement between
test probes 1 and 2 (see section
6.6) No connection (PC3)
PE(mains)-P1 Cable test: Testing is conducted
between the ground terminal at the
mains and test probe P1. Permanent connection
PE(TS)-P1 Testing is conducted between the
PE terminal at the test socket and
test probe P1. Test socket
LN(TS)-P1 //
PE(TS) Testing is conducted between
short-circuited LN mains termi-
nals at the test socket and test
probe P1, including PE at the test
socket. Test socket, VL2E,
AT3 adapter (AT3-IIIE, AT3-IIS,
AT3-IIS32), AT16DI/AT32DI,
LN(TS) – APP Testing is conducted between
LN(TS) and selected APP sock-
ets. Test socket, VL2E,
AT3 adapter (AT3-IIIE, AT3-IIS,
AT3-IIS32), AT16DI/AT32DI,
PE(mains) – APP Testing is conducted between
PE(mains) and selected APP
sockets. Permanent connection
PE(TS) – APP Testing is conducted between
PE(test socket) and selected APP
sockets. Test socket, VL2E,
AT3 adapter (AT3-IIIE, AT3-IIS,
AT3-IIS32), AT16DI/AT32DI,
P1 // PE(TS) –
APP Permanent connection
P2 – APP Testing is conducted between
probe P2 and selected APP sock-
ets.
APP – applied parts
Individual selection: A / B / C / D / E / F / G / H / I / K, respectively via on/off
UISO(set)
> 50 ... < 500 V Variable test voltage can be entered with the numeric keypad