Alstom MiCOM P846, Technical Manual

Page: 30 / 298

P846/EN TD/D Technical Data
(TD) 2-4
MiCOM P846
TD
lectromagnetic Compatibility
(EMC)
rst High Frequency Disturbance
200 Ω
Test
cuits and
Per IEC 60255-22-2: 1996, Class 4,
,
sient or Burst
Requirements
erity
IEEE/ANSI C37.90.1:2002:
cillatory applied
ntial mode to opto
B.
EIA(RS)232 ports excepted.
2 Level 4
ps and case
munity to Radiated Electromagnetic
y
er IEC 60255-22-3: 2000, Class III:
000
NSI C37.90.2: 1995:
0% square
ty from Digital
Per EN61000-4-3: 2002, Level 4:
800 to 960
munity from Digital Radio
Per ENV 50204: 1995
d Disturbances
ields
Per IEC 61000-4-6: 1996, Level 3,
mmunity
el 5,
100A/m applied continuously,
l 5,
n of 2s.
0.15 - 0.5MHz, 79dB
μ
V (quasi peak)
peak) 60dB
μ
V
ss A
30 - 230MHz, 40dB
μ
V/m at 10m
ce
m
E
1 MHz Bu
Test
Per IEC 60255-22-1: 1988, Class III,
Common-mode test voltage: 2.5 kV,
Differential test voltage: 1.0 kV,
Test duration: 2s, Source impedance:
EIA(RS)232 ports excepted.
100kHz Damped Oscillatory
Per EN61000-4-18: 2006 Level 3
2.5kV peak between independent cir
case earth.
1.0kV peak across terminal of the same circuit.
Immunity to Electrostatic Discharge
15kV discharge in air to user interface
display, and exposed metalwork.
Per IEC 60255-22-2: 1996, Class 3,
8kV discharge in air to all communication
ports.
6kV point contact discharge to any part of the
front of the product.
Electrical Fast Tran
Per IEC 60255-22-4: 2002. Test sev
Class III and IV:
Amplitude: 2 kV, burst frequency 5kHz
(Class III),
Amplitude: 4 kV, burst frequency 2.5kHz
(Class IV).
Applied directly to auxiliary supply, and
applied to all other inputs. EIA(RS)232
ports
excepted.
Surge Withstand Capability
4kV fast transient and 2.5kV os
common mode and differe
inputs (filtered), output relays, CTs, VTs,
power supply, field voltage.
4kV fast transient and 2.5kV oscillatory applied
common mode to communications, IRIG-
Surge Immunity Test
Per IEC 61000-4-5: 200
Time to half-value: 1.2/50 µs,
Amplitude: 4kV between all grou
earth,
Amplitude: 2kV between terminals of each
group.
Im
Energ
P
Test field strength, frequency band 80 to 1
MHz:
10 V/m,
Test using AM: 1 kHz / 80%,
Spot tests at 80, 160, 450, 900 MHz
Per IEEE/A
25MHz to 1000MHz, zero and 10
wave modulated.
Field strength of 35V/m.
Radiated Immuni
Communications
Test field strength, frequency band
MHz, and 1.4 to 2.0 GHz:
30 V/m,
Test using AM: 1 kHz / 80%.
Radiated Im
Telephones
10 V/m, 900MHz and 1.89GHz.
Immunity to Conducte
Induced by Radio Frequency F
Disturbing test voltage: 10 V
Power Frequency Magnetic Field I
Per IEC 61000-4-8: 1994, Lev
1000A/m applied for 3s.
Per IEC 61000-4-9: 1993, Level 5,
1000A/m applied in all planes.
Leve Per IEC 61000-4-10: 1993,
100A/m applied in all planes at
tio 100kHz/1MHz with a burst dura
Conducted Emissions
Per EN 55022: 1998: Class A
66dB
μ
V (average)
0.5 - 30MHz, 73dB
μ
V (quasi
(average).
Radiated Emissions
Per EN 55022: 1998: Cla
measurement distan
230 - 1GHz, 47dB
μ
V/m at 10
measurement distance.