Zeiss Argon Ion Beam System, Инструкция по эксплуатации

Страница: 8 / 32

U=çÑ=PO fåëíêìÅíáçå=j~åì~ä=^êÖçå=fçå=_É~ã=póëíÉã=ÉåMOKÑã
OK=p~ÑÉíó=ëìãã~êó
fåíÉåÇÉÇ=ìëÉ
2. Safety summary
2.1. Intended use
The Argon Ion Beam System is an optional additional ion beam column to the Carl Zeiss
CrossBeam
®
model NVision 40. With this column, the NVision becomes a triple beam system.
The Argon Ion Beam System allows you to scan a focused beam of argon ions across the
specimen in order to remove material from the specimen surface.
The main use of the Argon Ion Beam System is to remove implanted gallium and amorphous
layers from TEM lamellas by fine polishing with low kV argon ions.
2.2. Prevention of accidents and of improper use
CAUTION
Risk of injury or damage due to improper operation of the option.
Read the user documentation carefully.
Do not operate the option until you have completely read and understood this instruction
manual and the entire user documentation delivered with the workstation. You will find the
user documentation in the document folder.
CAUTION
Risk of property damage due to improper maintenance, service, or repair.
The warranty might be voided.
Follow the instructions given in this instruction manual.
IMPORTANT
All pursuing tasks of maintenance, service, and repair not described in this instruction
manual have to be performed by authorised Carl Zeiss service staff only.