Ethernet
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178
Numerical counters are provided to show the status of the test, with a basic summary of the TIE information.
l
Current TIE:
Shows the current time interval error measurement.
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Max TIE:
Maximum positive TIE value that has been recorded since the beginning of the test.
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Min TIE:
lowest or negative TIE value that has been recorded since the beginning of the test. Since
wander measurements always start with a TIE=0, then the minimum value can only be zero or neg-
ative.
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MTIE:
Denotes the maximum span of TIE values recorded since the beginning of the test. In this
summary, MTIE = MaxTIE – MinTIE. This gives an idea of how much the signal under test is wan-
dering.
A real-time
TIE monitor graph
may also be included in the summary screen for users to see the TIE for
the last 7 or 10 minutes of the ongoing test.
Built-in MTIE & TDEV Analysis (Optional)
Wander Analysis and MTIE / TDEV Post Analysis are optional features.
This option enables the test set to analyze up to 72 hours’ worth of wander measurement data and compare it
against standard masks for a PASS/FAIL assessment, without the need for a PC. The test set may allow the
analysis to be performed while the test is still running for run-time verification. Longer test take a lot longer to be
analyzed, so the VeEX Wander Analysis PC Software is recommended for tests longer than 24 hours. Tap on
TIE
to view TIE, MTIE and TDEV Analysis.
Features:
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Provides further post-processing of clock stability data, such as MTIE and TDEV
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Frequency offset calculation and removal for relative TIE analysis
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Standard MTIE and TDEV masks can be selected
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MTIE and TDEV results and mask export to CSV for further report generation using spreadsheets
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Direct PDF report generation to USB
Содержание MTX150 Series
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