Toshiba e-STUDIO 20CP, Руководство по обслуживанию

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Diagnostic Aids
3-11
5060-XXX
Once the maximum pass count or fail count is reached, the test is stopped, the power
indicator is turned on solid, and the final results display. If the test fails, the message
SDRAM Error displays for approximately three seconds and the failure count increases
by 1.
ROM Memory Test
The ROM Memory Test is used to check the validity of the controller board code and
fonts.
To run the ROM Memory Test:
1.
Select ROM Memory Test from the menu. P and F represent the same numbers for
DRAM.
–
The power indicator blinks indicating the test is in progress. The test runs
continuously.
2.
Press Return/Stop to exit the test.
Each time the test finishes, the screen updates with the result. If the test passes, the Pass
Count increases by 1, however if the test fails, one of the following messages displays for
approximately three seconds:
ROM Checksum Error
ROM Burst Read Error
Once the maximum pass count or fail count is reached, the test stops with the power
indicator on solid. The final results display on the screen.
Parallel Wrap Test
Use this test with a wrap plug to check operation of the parallel port hardware. Each
parallel signal is tested.
To run the Parallel Wrap Test:
1.
Disconnect the parallel interface cable and install the wrap plug (P/N 1319128).
2.
Select the Parallel Wrap Test from the menu.
–
The power indicator blinks indicating the test is in progress. The test runs
continuously until canceled.
Each time the test finishes, the screen updates. If the test passes, the Pass Count
increases by 1, however if the test fails, one of the following messages displays for
approximately three seconds:
Sync Busy Error
Byte Interrupt Request Error
Strobe Interrupt Request Error
Init Fail Error
Init Busy Error
Init Rise Error
Host Busy Error
RAM Data FF Error