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Version 5.01 – July 2012 / SW Version: 2012.06.12Errore. Per applicare Nadpis 1 al testo da visualizzare in questo punto, utilizzare la scheda Home.
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4.9 PROBE Sub-Menu (SETTING)
This sub-menu allows setting of basic probe
parameters to enable basic calculations of
main variables, e.g. near field N, probe
equivalent diameter D
eff
, etc.
All probe parameters are saved with the
instrument settings (Setups) – see 3.6.1.
Save Setup.
PROBE Sub-Menu Items on the Screen – Left Side:
4.9.1
XTAL FREQ
Probe crystal main frequency value. The wave length value, calculated for actual
frequency and material velocity, is displayed below the frequency value as
λ
m= X.XX mm
.
4.9.2
XTAL SHAPE
Setting the probe crystal shape:
-
Disc,
-
Rectangle,
-
Unknown.
4.9.3
Diam eff / WIDTH eff
Setting the probe crystal effective diameter (for Disc or Unknown shape) or effective
width (for Rectangle shape).
4.9.4
LENGTH eff/ Near Field
Setting the probe crystal effective length (for Rectangle shape) or near field value (for
Unknown shape).
γ
-6dB=X.X°
is the beam divergence angle at -6 dB drop.
4.9.5
PROBE DELAY
Adjustment of probe delay line value (e.g. for dual element or angle probe) within the
range from -10.00
µ
s to 4800.00
µ
s.
The instrument calculates the probe delay value based on DELAY LEN and DELAY
VEL values and shows the calculated value just below the PROBE DELAY value in
gray as
DLY: X.XX
µ
s
.
This calculated value becomes a “stopper” for manual setting of the PROBE DELAY.