ZEISS
OPERATION
Axio Imager 2
Illumination and contrast methods
186
430000-7544-001
01/2016
4.12.8
Setting reflected-light darkfield
(1)
Application
The reflected light darkfield technique is used to examine specimens that not only have reflective surfaces
of different reflectivity (ideal brightfield objects), but also exhibit scratches, cracks, pores, i.e. flat surface
deviations. All these light-scattering details shine brightly in the darkfield whilst the reflective flat surfaces
stay dark.
(2)
Instrument equipment
−
Axio Imager MAT with connected and adjusted HAL 100 halogen illuminator.
−
Epiplan-Neofluar, EC Epiplan-Neofluar, Epiplan objectives additionally labeled "HD".
−
Reflector module DF P&C, 6x20 compensator mount with darkfield stop for reflected light (424706-
0000-000) or 4-position modulator turret
(3)
Setting reflected-light darkfield
•
Prepare the microscope as described in Section 4.12.7 for reflected-light brightfield. The luminous-
field diaphragm should just disappear from the field of view to avoid reflections.
•
Rotate the reflector turret to move the DF P&C reflector module into the light path.
•
If the 6x20 compensator mount is used, remove the 6x20 slider, if necessary. If the 4-position
modulator turret is used, set the
H/D
position.
•
Rotate the nosepiece to swing in the darkfield objective (HD).
•
Fully open the aperture diaphragm and remove any neutral filter from the light path.
•
Place the specimen on the stage and bring it into focus.
