Keysight E3632A, User Manual

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Error Messages 4

Self-Test Error Messages
E3632A User’s Guide 135
Self-Test Error Messages
The following errors indicate failures that may occur during
a self- test. Refer to the
Service Guide for more information.
Table 4-2 Self-test error messages
601 Front panel does not respond
The main controller U17 ( U10 for serial MY53xx6xxx ) attempts to establish serial communications with
the front panel controller U7 ( U602 for serial MY53xx6xxx ) on the front panel board. During this test, the
U7 ( U602 for serial MY53xx6xxx ) turns on all display segments. Communication must function in both
directions for this test to pass. If this error is detected during power-on self-test, the power supply will
beep twice. This error is only readable from the remote interface.
602 RAM read/write failed
This test writes and reads a 55h and AAh checker board pattern to each address of RAM U14. Any
incorrect readback will cause a test failure. This error is only readable from the remote interface.
603 A/D sync stuck
The main controller issues an A/D sync pulse to U17 and U18 to latch the value in the ADC slope
counters. A failure is detected when a sync interrupt is not recognized and subsequent time-out occurs.
604 A/D slope convergence failed
The input amplifier is configured to the measure zero (MZ) state in the 10 V range. This test checks
whether the ADC integrator produces nominally the same number of positive and negative slope
decisions (±10%) during a 20 ms interval.
605 Cannot calibrate rundown gain
This test checks the nominal gain between integrating ADC and the U17 on-chip ADC. This error is
reported if the procedure can not run to completion due to a hardware failure.
606 Rundown gain out of range
This test checks the nominal gain between the integrating ADC and the U17 on-chip ADC. The nominal
gain is checked to ±10% tolerance.
607 Rundown too noisy
This test checks the gain repeatability between the integrating ADC and the U17 on-chip ADC. The gain
test (606) is performed eight times. Gain noise must be less than ±64 LSB of the U17 on-chip ADC.
608 Serial configuration readback failed
This test re-sends the last 3 bytes of serial configuration data to all the serial paths (SERDAT, SERBCK,
SERCLK). The data is then clocked back into U18 and compared against the original 3 bytes sent. A
failure occurs if the data do not match. This tests checks the serial data path through U22.