JDS Uniphase SmartClass E1, User Manual

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Appendix B Specifications
E1 circuit testing specifications
SmartClass E1 Tester User’s Guide 115
E1 circuit testing specifications
Table 40 describes the E1 circuit testing specifications.
Bit Rate Range: 2.048 MHz ± 512 Hz
Accuracy: ±5 ppm, +1 ppm per year aging
Resolution: 1 Hz
Level Measurement Range: +3 to -37 dBnom
Accuracy (assumes All Ones pattern):
+3 to -15 dBnom, ± 1 dB
-15 to -30, ± 2 dB
-30 to -37, ± 3 dB
Resolution: 0.01 dBnom
Slip Reference Opposite Rx, External 2M Reference Clock
External 2M Refer-
ence Clock – 0.5 to 3 V square or sine wave
– 2.048 MHz
– Unbalanced/ 75 ohms (at adapter cable input)
Table 39 Receiver specifications (Continued)
Parameter Specification
Table 40 E1 circuit testing specifications
Parameter Specification
General Framed and unframed test signal generation
Bulk, n x 64 kbit/s BERT
G.821, G.826, M.2100 analysis
Error and alarm and generation and analysis
Round Trip Delay
Signal Level and Frequency
Audio Monitor
Si, Sa, A-bit, and E-Bit (REBE) monitoring and gen-
eration
Test Modes Terminate, Monitor, Bridge, Line Loopback
Performance Measurement G.821, G.826, M.2100
Test Patterns 2^6-1 (ITU), 2^9-1 (ITU), 2^11-1 (ITU), 2^15-1 (ITU
& ITU INV), 2^20-1 (ITU & ITU INV), 2^23-1 (ITU &
ITU INV), QRSS, QBF
1:1, 1:3, 1:4, 1:7
User Bit Patterns 3 to 32 bits
User Byte Patterns 1 to 64 bytes
Live
Delay
Auto (via Auto Configure)
Anomaly (Error) Injection Bit (TSE): Single, rate, multiple
Code, CRC, Pattern Slip,
E-Bit (REBE): Single
FAS: Single, 2, 3, 4
MFAS: Single, 2