PhaseStation 53100A User’s Manual V1.04 25-Apr-2022
96
Show xDEV error bars (
Ctrl-e
)
When enabled, this option draws “error bars” at each tau bin in Allan deviation and other
statistical plots. These bars approximate the ± one-sigma (68%) confidence interval at
±
σ/
sqrt(N/M), where N is the number of phase-record samples that contribute to each bin and
M is the bin’s
τ
0
multiple.
This calculation does not take either the deviation type or the noise slope into account, so it
should be considered a rough estimate of the actual confidence interval obtainable through
more sophisticated offline analysis. Consider exporting your phase data to Stable32 (page 78) if
your application requires better confidence-interval estimates.
Clip xDEV traces by noise bandwidth (
Ctrl-b
)
This display option is used to suppress artifacts near the tau-zero points in Allan
deviation and other statistical plots that can appear when incoming data is oversampled
for lowpass filtering. xDEV values at tau intervals close to the sample rate may appear
to “droop” in such cases, since the data has been band-limited at a cutoff frequency
below its Nyquist rate.
A discussion of this effect appears on page 48.
Clip xDEV traces by confidence (
Ctrl-v
)
This display option is used to avoid rendering Allan deviation and other xDEV traces
beyond the point where insufficient data is available for good statistical confidence. It is
enabled by default.
Specifically, when this option is enabled, the only xDEV bins that are drawn are those
whose phase data sample count (N) is >= 2x their
τ
0
multiple (M).
Figure 44: Allan deviation error bars
Summary of Contents for PHASE STATION 53100A
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